Test & Measurement - SALUKI

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Spectrum/Signal Analyzers Signal Generators Network Analyzers Comprehensive Testers Microwave Power Meters Noise Figure Analyzer RF Record&Playback Instruments Ultra-wideband Channel Simulator Bit Error Rate Tester

General Electronic Test Equipments
Radiation Analyzer and Gamma Spectrometer Low Noise Precision Power Supply Cable/Harness Tester Winding Component EST Tester Ground Bond Tester Impulse Winding Tester Parallel Hipot Tester(AC/DC) Frequency Counters DC Power Supplies AC Power Supplies DC Electronic Loads Impedance Analyzers LCR Meters Resistance Meters AC/DC Hipot Testers Digit Multimeters Capacitor Leakage Current/IR Meter Digital AC Millivoltmeter Battery Tester fA meter/ Electrometer/ High Resistance Meter Precision source/Measure unit Semiconductor C-V Characteristic Analyzer DC Bias Current Source Automatic Transformer Test system

Amplifiers
Power Amplifiers Solid State Power Amplifiers

Optical Test Equipments
High-speed Optical Component Measurement Optical Spectrum Analyzers OTDRs & Optical Tools Fusion Splicers

Scientific Instruments
Atomic Force Microscope Digital Lock-In Amplifiers Time-Correlated Single-Photon Counting System

EMC Test Equipments
EMI Test Equipment

Satellite Communication Equipments
Microwave Converters GPS/GNSS Simulators
Distributed Products

SigOFIT Optical-fiber Isolated Probe
Optical-fiber Isolated Probe

Data Acquisition
Data Acquisition System
Brands

Ceyear
RF Components

Calibration Kits
Mechanical Calibration Kits Waveguide Calibration Kits Electronic Calibration Module Coaxial Loads

Coaxial Adapters
RF Adapters NMD Adapters

Cable Assemblies
VNA Phase Stable Cable Assemblies RF Test Cable Assemblies

Active Components
Mixers Power Detectors Power Amplifier Module Low Noise Amplifiers (DC Powered) Low Noise Amplifiers (AC Powered) Programmable Step Attenuators

Passive Components
Limiters Hybrids Circulators Duplexers & Multiplexers Filters Isolators Couplers Phase Shifters Power Dividers Coaxial Attenuators Coaxial Switches

Others Accessories
Antennas Torque Wrench Connector Gage Kits
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CurrentHome>Test & Measurement

Series / Products

Frequency

Displayed Average Noise Level @1GHz

Phase Noise@1 GHz

Multi-Functional Atomic Force Microscope-Pro

100 μm x100 μm x10 μm

XY: 0.4 nm
Z: 0.04 nm

EFM, KPFM, PFM, SCM, MFM, C-AFM(Option)
Wafer-Level Atomic Force Microscope-Max

Maximum 100 μm x 100 μm x 10 μm

Z: 0.05 nm;
X/Y: 0.5 nm

EFM, KPFM, PFM, MFM
SFT1010 Time-Correlated Single-Photon Counting System

16ps

10ns

1
SFT1040 Time-Correlated Single-Photon Counting System

16 ps

10 ns

4
SMT16 High-resolution time-correlated single photon counting system

1ps

2ns

4/8/16
SST08 Lightweight Time-Correlated Single-Photon Counting System

4ps

4ns

9

Saluki Technology