The AtomEdge Pro multi-functional atomic force microscope can perform 3D scanning imaging of materials, electronic devices, and biological samples. It features multiple operating modes, including contact, tapping, and non-contact, providing users with more flexible and precise operation options. Furthermore, it integrates various functional modes such as magnetic force microscopy, electrostatic force microscopy, scanning Kelvin microscopy, and piezoelectric force microscopy, offering strong stability and excellent expandability. In addition, functional modules can be flexibly customized according to user needs, providing targeted solutions for specific research fields and realizing a highly efficient, multi-functional detection platform.
Multi-Functional Atomic Force Microscope-Pro
Key Features
40pm ultra-high vertical resolution
Intelligent focusing, needle insertion, and parameter adjustment functions for simple operation
XYZ desktop scanner achieves distortion-free, realistic imaging
Integrated AI scientific research model with virtual expert support throughout the process
Self-developed AFM core "power source," FPGA high-speed controller system
Powerful functional configuration, featuring multi-functional measurement modes including nanoforce, magnetism, and electricity
Built-in powerful analysis software
| Technical Specifications | |
| Sample Size: | Compatible with samples up to 25 mm in diameter |
| Scanning Method: | XYZ triaxial full sample scanning |
| Scanning Range: | 100 μm x 100 μm x 10 μm |
| Scanning Rate: | 0.1 Hz ~ 30 Hz |
| Z-axis Noise Level: | 0.04 nm |
| Nonlinearity: | XY direction: 0.02%, Z direction: 0.08% |
| Image Sampling Points: | 32×32 to 4096×4096 |
| Operating Modes: | Contact mode, tapping mode, phase imaging mode, lift-up mode, multi-directional scanning mode |
| Multifunctional Measurement: | EFM, KPFM, PFM, SCM, MFM |
| Optional | C-AFM |
Main Machine
| Module No. | Item | Description |
| SAFM-PRO | Measurement mode | Electrostatic force microscopy (EFM); Scanning Kelvin microscopy (KPFM); Piezoelectric force microscopy (PFM) Scanning capacitance atomic force microscopy (SCM); Magnetic force microscopy (MFM); |
Options
| Module No. | Item | Description |
| C-AFM | Measurement mode | Conductive Atomic Force Microscopy |
