High Speed, High End and High Magnification 16K Linescan Applications.

The extremely high resolution 3.5μ pixel size and high magnification SC series line scan lenses apply to a such big image circle from 60mm to 100mm are specially developed for semiconductor and Mini LED industry, used for silicon wafer AOI and OLED surface defect inspection and customized magnifications from 1X, 2.5X, 3.5X to 5X as well as wavelength, focal length, working distance, FOV, are available.

Key Features

F2.59, High brightness

Large format Ø62mm, 16K3.5μ

Excellent uniformity of entire field

Extremely high resolution

High contrast

Low distortion

Model

SC-1X-62

O/I Distance

451.7mm

Magnification

1.0X

NA

0.091

Image Format

Ø62mm

Resolution

3.5μm

Wavelength

430nm~650nm

WD

174.5mm

Optical Distortion

<0.01%

F.NO

2.59(∞)

Main Machine

Module No. Item Description
SC-1X-62 16K3.5μ Line Scan Lens 1X O/I Distance: 451.7mm; Large format Ø62mm, 16K3.5μ

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